Ionic charge distributions in silicon atomic surface wires
نویسندگان
چکیده
Using a non-contact atomic force microscope (nc-AFM), we examine continuous dangling bond (DB) wire structures patterned on the hydrogen terminated silicon (100)-2 × 1 surface.
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ژورنال
عنوان ژورنال: Nanoscale
سال: 2021
ISSN: ['2040-3372', '2040-3364']
DOI: https://doi.org/10.1039/d0nr08295c